Electron Microscopes (AMS Interpretation)

'Electron' Microscopes (AMS Interpretation)

Electron microscopes do not image “particles,” but forced AMS-matter coupling paths.

  • The so-called “electron beam” is a highly collimated AMS torsion conduit
  • Matter samples distort this conduit via their vorton topology
  • Detectors record reconfiguration thresholds, not trajectories

Resolution is high because:

  • Short-wavelength AMS torsional modes are used
  • These modes couple strongly to fine-scale vorton geometry

Thus, electron microscopy is AMS probing of matter topology, not particle imaging.

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