Electron Microscopes (AMS Interpretation)
'Electron' Microscopes (AMS Interpretation)
Electron microscopes do not image “particles,” but forced AMS-matter coupling paths.
- The so-called “electron beam” is a highly collimated AMS torsion conduit
- Matter samples distort this conduit via their vorton topology
- Detectors record reconfiguration thresholds, not trajectories
Resolution is high because:
- Short-wavelength AMS torsional modes are used
- These modes couple strongly to fine-scale vorton geometry
Thus, electron microscopy is AMS probing of matter topology, not particle imaging.
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